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Multi-ContactWedge
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MULTI-CONTACT WEDGE allows for more chip design flexibility because it is custom configured to your circuit. Four Wedges can be used at the same time to probe a complete chip.
With its individually spring loaded, Beryllium-Copper tips, the Multi-Contact Wedge provides reliable contacts, even when probing non-planar structures. This reliable low resistance contact is one of the keys to providing highly repeatable measurements. The Multi-Contact Wedge also provides direct viewing of the probe tips for accurate positioning.
When used with standard microwave probe stations the Wedges can first be positioned to any microwave calibration standard and then moved into position on the MMIC or Module to be tested.
The probe points on a Wedge can even be set to different depths so that multi-level modules can be successfully probed. Any pitch (tip spacing) from 50 to 1250 microns may be specified. Larger pitch probes are available by special order. The probes can be configured with Ground-Signal-Ground (G,S,G), Ground-Signal (G,S), or Signal-Ground (S,G) tip footprints.
Connection to the Model 40A is through a female K connector and is compatible with SMA and 3.5mm connectors. Connection to the Model 50A is through a female 2.4mm connector. Connection to the Model 67A is through a female V connector and is compatible with the 2.4mm connector. Connection to the Model 110A is through a W (1.1mm) or a 1.0 mm connector.
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