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射频探针 双针
DUALMICROWAVEPROBE consistsoftwoseparateprobesmountedonasingleholder.Oneprobeisfixedtotheholder;theotherisadjustable.EachprobemaybeindividuallyconfiguredwithGSG,GS,orSGfootprintshavinganyfixedpitchfro
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DUAL MICROWAVE PROBE consists of two separate probes mounted on a single holder. One probe is fixed to the holder; the other is adjustable. Each probe may be individually configured with GSG, GS, or SG footprints having any fixed pitch from 50 to 2540 microns. The probe to probe (signal to signal) spacing is user adjustable over a 4000 micron (160 mil) range. When ordering, an initial signal to signal spacing should be specified (up to .75 inches).
Features
- Two probes on one positioner
- Ground to signal spacing from 50 to 2540 microns
- Signal to signal spacing is user adjustable
- Same performance as individual Model 40A, 50A, 67A, and 110H probes
- Patented coaxial design
- Differential calibration substrates available for two, three and four port calibrations
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